We use cookies to improve your experience. By your continued use of this site you accept such use. To change your settings please see our Privacy Policy.
Close

Total Analytical solution of Solar Cell

MA-tek In-house Services 

 

Structure

  • Optical (surface morphology)
  • SEM-FIB (grain size, grain orientation, defect characterization)
  • XTEM (layer thickness measurement, defect characterization, phase identification)

Chemical

  • SIMS (doping concentration, impurity contamination)
  • EDS (materials composition/constituents)

FA

  • EMMI (Emission Microscope)
  • SAT (Scanning Acoustic Tomography)

  

Out Sourcing Services 

 

Solderbility and Film Adhesion

 

Optical Analysis

  • Reflectivity
  • Ellipsometer (film thickness)

PV (Photo Voltaic) Analysis

  • I-V tester (Isc, Voc, FF, , Rs, Rsh)
  • Light intensity effect, Temperature effect
  • Quantum efficiency (External, Internal)
  • Spectral response

Electrode contact resistance

 

Light induced degradation