How can we help you? Get in touch with us
|
LED Industry |
|
||||||||||||||||||||||
|
Reliability Testing |
|
Reliability Testing Service |
|
||||||||||
|
LED Reliability Testing Facilities |
![]() |
|
ESD, Latch-up, Testing/Wire Bonding |
![]() |
|
LED ESD Testing |
![]() |
|
X-ray Inspection |
|
X-ray Photography |
![]() |
|
X-ray lnspection of LED |
![]() |
|
Failure Analysis (FA) |
|
Thermal, EMMI/InGaAs,OBIRCH |
Defect Localization by EMMI/InGaAs, OBIRCH
![]() |
EMMI/InGaAs, OBIRCH for FA Application
![]() |
|
Texturing (Surface Morphology) |
|
Optical Profiler |
|
|
|
|
Texturing (Surface Morphology) |
![]() Surface morphology of LED die surface roughness after RIE etching or ion bombardment. |
|
|
Chip Structure and Film Thickness |
|
SEM, DB-FIB, TEM |
X-S view SEM |
|
|
Chip Structure and Film Thickness |
![]() Precise X-S view by DB-FIB |
|
![]() X-S view TEM |
(a)MQW and super lattice;(b)HR TEM of MQW;(c)PSS and buffer layer |
|
Crystalline Defects (Dislocations) |
|
X-S TEM, P-V TEM |
TEM Imaging (Dislocations in epitaxial butter layer) |
![]() X-S & P-V TEM at requested area to observe the dislocation density and its spatial distribution |
|
|
Depth Profiling of Elemental Analysis |
|
TEM/EDX, SIMS |
EM/EDX Line Profile – Blue LED – MQW and Superlattice
![]() In% in superlattice can be defected down to 0.2at% |
Elemental Depth profile by SIMS
![]() SIMS is also feasible now. |














