We use cookies to improve your experience. By your continued use of this site you accept such use. To change your settings please see our Privacy Policy.
Close

Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms

Software

MA-tek FTP

Sustainability report

How can we help you? Get in touch with us

EELS

Technical Concept

Electron Energy Loss Spectroscopy(EELS)equipped on TEM is a powerful technology to analyze the composition of the elements.

The energy resolution of EELS is 1eV or less. By coupling with the functions of TEM, the spatial resolution can be better than 1nm. So EEELS/TEM became one of the popular technology for composition analysis.

 

(a) 300KV Tita

(b) Gatan 965 EELS

 

 Filtered imaging of EELS was used to analyze layer’s structure of the low-k materials.

 

 

Near the edge, fine structures of EELS were used to analyze the chemical state of the oxygen in different materials of the 16nm high-k materials.

 

 

EELS line-scanning analysis was used to inspect the processes of 16nm Low-k materials.

 

 

Contact

Taiwan Lab

Mr. Hsu

: +886-3-6116678 ext:4503

: +886-970-025 296

rd@ma-tek.com