OP
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Technical Concept |
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Optical Profilers (OP) are based on white light interference caused by the interaction between light and material surface and thus can be used to resolve the morphology of sample surfaces. |
Based on white light interference, optical profilers (OPs) have been used to detect surface morphology. Interference is caused by the interaction between light and material surface and thus can be used to resolve the morphology of sample surfaces. This technology is widely applied for inspecting gold fingers of flexible printed circuit boards, masks, surface defects, the surface roughness of light-emitting diodes, and gaps between films.
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Equipment |
Nano View NVE-10100 |
Bruker Contour GT |
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Applications |
 Topography of surface with defects. (a) OP and (b) SEM images. |
 (c) OP image of PCB gold (d) OP image of Cr-metal mask |
 (e) and (f) OP and SEM images of a gold bump. |
 (g) OP image of metal electrodes on a LED crystalline grain (h) OP image of a photoresist spacer for thin film panel. |
 Size measurement for a LED crystalline gran by OP inspection. |
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Contact |
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