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About

MA-tek is the worldwide leading analytical lab providing comprehensive and high-quality services.

Services

We provide wide span of materials, structure analysis, surface analysis, failure analysis, and reliability test.

Applications

We provide analytical consulting and technical support to high-tech industries, semiconductor manufacturing to system integration.

Tech Article

As the best R&D partners, we are willing to share our new insights and technical details with you.

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All of the financial information are open and transparent to our shareholders.

Career

Aim to work as a medical center for high-tech industries, MA-tek welcome talents with professional background to join us.

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MA-tek had been certificated by ISO 9001, 27001, 17025, 15408 and ESD20.20. You are welcome to download the certificates for reference.

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Non-destructive Analysis (NDA)

Circuit Edit (CKT)

Materials Analysis (MA)

Application Forms

Software

MA-tek FTP

Sustainability report

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AFM

Technical Concept

Atomic Force Microscope (AFM) uses a sharp tip/probe mounted on a cantilever to scan the sample surface to sense surface electronic and magnetic properties.

 

An atomic force microscope (AFM) uses a sharp tip/probe mounted on a cantilever to scan the sample surface of interest. By bringing the scanning tip to the surface, the cantilever being shined by the laser will bend due to the van der Waals force between the tip apex and the surface. The reflected laser is detected by a photo sensor and its shift position can be converted to the surface morphology.

 

Two main scanning modes, contact, and tapping have been widely adopted for different applications. Based on the current configuration of the system, a scanning capacitor microscope (SCM) can be also carried out to provide an additional application for the IC industry. Still, more applications based on AFM technology are continually been developed to sense surface electronic and magnetic properties.

 

 

 

 

Application
  1. <100um surface morphology
  2. Roughness analysis
  3. Local dimension and height measurements
  4. 3D image analysis
  5. Thin film surface structure or defect analysis, maximum sample size: 12” wafer

 

 

 

Equipment

AFM (Bruker ICON)

 

 

 

 

Application Case

(a) Surface roughness analysis

(b) 3D image

 

Section Analysis

  

 

 

Contact

Taiwang Lab

Ms. Liu

: +886-3-6116678 ext：3972/3966

: +886-952-303-813

: xrd@ma-tek.com

Shanghai Lab

Mr. Yang

: +86-21-5079-3616 ext：7201

: 137-6486-2001

: xps_sh@ma-tek.com

Contact us !