We use cookies to improve your experience. By your continued use of this site you accept such use. To change your settings please see our Privacy Policy.
關閉

IC產品電性故障EFA的應用實例

Cases Study I - IDDQ & ESD Fail

 

 

Cases Study II - Isb Leakage Fail

 

 

Cases Study III - Gate Leakage Fail

 

 

Micro Pits on Si substrate, which induced Dielectrics Breakdown in the channel region