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關於閎康

MA-tek is the worldwide leading analytical lab providing comprehensive and high-quality services.

服務項目

We provide wide span of materials, structure analysis, surface analysis, failure analysis, and reliability test.

產業應用

We provide analytical consulting and technical support to high-tech industries, semiconductor manufacturing to system integration.

技術文章

As the best R&D partners, we are willing to share our new insights and technical details with you.

投資人關係

All of the financial information are open and transparent to our shareholders.

人力資源

Aim to work as a medical center for high-tech industries, MA-tek welcome talents with professional background to join us.

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MA-tek had been certificated by ISO 9001, 27001, 17025, 15408 and ESD20.20. You are welcome to download the certificates for reference.

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LED產業應用方案

分析類型

適用項目
 

可靠度測試

環境測試、電氣測試、亮度測試

X-光射線檢測服務

X-光射線非破壞性檢測

故障定位

熱顯像、紅外線微光顯微鏡、雷射光束電阻異常偵測

表面型態

光學干涉形貌儀、掃描式電子顯微鏡、穿透式電子顯微鏡

薄膜種類及厚度

掃描式電子顯微鏡/X光微區分析、穿透式電子顯微鏡/X光微區分析

晶片結構

 掃描式電子顯微鏡/X光微區分析、穿透式電子顯微鏡/X光微區分析

晶體缺陷觀察(差排)

穿透式電子顯微鏡

元素深度分布圖

穿透式電子顯微鏡/掃描式電子顯微鏡、二次離子質譜儀

汙染物鑑定分析

歐傑電子顯微鏡、X-光學電子能譜分析儀

 

 

 

 

可靠度測試

可靠度測試服務

測試類型 

      適用項目
 

Environmental Test
  • Temperature Cycling Test (TCT) & Thermal Shock Test (TST)
  • High Temperature Storage Test (HTST) & Low Temperature Storage Test (LTST)
  • Temperature & Humidity Storage Test (THST)
  • Temperature & Humidity with Bias Test (THB Test)
  • Vibration Test / Mecharical Shock Test / Drop Test
  • Pre-conditionong Test (MSL 1-6) & Reflow Test
  • Solderability Test
  • Autoclave (AC) Test & PCT (US-HAST) Test

Electrical

Test
  • Operation Lift Test (OLT) & Bias Lift Test (BLT)
  • High Temperature Reverse / Gate Bias (HTRB / HTGB) Test
  • Highly Accelerated Stress Test (HAST)
  • High Humidity High Temperature Reverse Bias (H3TRB) Test
  • Power & Temperature Cycle (PTC) Test
  • Hot Carrier Test (HCI)
  • Deliverables for recommended board design

LED Lighting

Test
  • Temperature & Humidity Storage / On-off Plus Operation
  • High / Low Temperature Storage / On-off Plus Operation
  • Highly Accelerated Stress Test / On-off Plus Operation
  • Thermal Shock (Air to Air) / On-off Plus Operation
  • High / Room / Low Temp. Burn-in Test / On-off Plus Operation

 

可靠度測試設備

 

靜電測試、電性栓鎖測試、打線

 

LED靜電測試

 

 

 

X-光射線檢測服務

X-光射線顯像

 

LED的X-光射線檢測

 

 

 

故障定位

熱顯像、紅外線微光顯微鏡、雷射光束電阻異常偵測

EMMI/InGaAs,OBIRCH 缺陷偵測定位

 

EMMI/InGaAs,OBIRCH 於故障分析應用

 

 

 

表面型態

光學干涉形貌儀

 

掃描式電子顯微鏡 

掃描式電子顯微鏡俯視圖；LED晶粒表面粗化觀察

 

 

 

 

晶片結構及薄膜厚度

掃描式電子顯微鏡

掃描式電子顯微鏡橫切面圖

 

 

雙粒子束斷層掃描

 雙粒子束斷層掃描精密縱切面圖

 

 

穿透式電子顯微鏡

穿透式電子顯微鏡縱切面圖

  

 

(a)MQW and super lattice；(b)HR TEM of MQW；(c)PSS and buffer layer

 

 

 

晶體缺陷觀察(差排)

穿透式電子顯微鏡(磊晶緩衝層的晶體缺陷)

 


指定區域拍攝穿透式電子顯微鏡，觀察排差的密度和排差的走向

 

 

 

 

物質深度分布圖

穿透式電子顯微鏡/X光微區分析，二次離子質譜儀

EM/EDX Line Profile – Blue LED – MQW and Superlattice


在超晶格層的In%可達到0.2at%的鑑定極限

  

 

Elemental Depth profile by SIMS


二次離子質譜儀可以有效改善縱深的解析度，閎康科技每日可提供5-10個試樣的分析服務

  

 

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